Templated fabrication and characterization of SiO{sub 2} nanotube covered Fe nanowires

Journal Article · Wed May 07 04:00:00 EDT 2014 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4868620· OSTI ID:22273744

Dastagir, Tawab; Yu, Hongbin ^[1]

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1. Ira A. Fulton Schools of Engineering, School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, Arizona, 85287 (United States)

In this study, Fe nanowires coated with SiO{sub 2} nanotubes have been synthesized by electrodeposition method using anodic alumina oxide template. Before growing Fe nanowires, 6–8 nm thick SiO{sub 2} nanotubes are grown inside the template using a “surface sol-gel” technique. The nanotube structures were characterized by field emission scanning electron microscopy and energy dispersive x-ray spectroscopy. Magnetic properties of the SiO{sub 2} insulated Fe nanowires inside the membrane are characterized by superconducting quantum interference device. Coercivities of around 120 Oe with field parallel to the nanowire axis and 240 Oe with field perpendicular the nanowire axis are observed at room temperature. These values are comparable to Fe nanowires without insulating layer in membrane. The magnetic hysteresis loop suggests that the SiO{sub 2} insulated nanowires have uniaxial magnetic anisotropy with the easy axis magnetization direction along the nanowire arrays due to their large shape anisotropy.

• OSTI ID: 22273744
• Journal Information: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 17 Vol. 115; ISSN JAPIAU; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
77 NANOSCIENCE AND NANOTECHNOLOGY
ALUMINIUM OXIDES
ANISOTROPY
COERCIVE FORCE
COMPARATIVE EVALUATIONS
ELECTRODEPOSITION
FABRICATION
FIELD EMISSION
HYSTERESIS
IRON
LAYERS
MAGNETIC PROPERTIES
MAGNETIZATION
NANOTUBES
QUANTUM WIRES
SCANNING ELECTRON MICROSCOPY
SILICON OXIDES
SQUID DEVICES
TEMPERATURE RANGE 0273-0400 K
X-RAY SPECTROSCOPY