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Effect of Pr- and Nd- doping on structural, dielectric, and magnetic properties of multiferroic Bi{sub 0.8}La{sub 0.2}Fe{sub 0.9}Mn{sub 0.1}O{sub 3}

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.4870454· OSTI ID:22273658
; ;  [1]; ;  [2]; ;  [3]
  1. Department of Physics, Indian Institute of Technology (Banaras Hindu University), Varanasi 221005 (India)
  2. Department of Physics, Banaras Hindu University, Varanasi 221005 (India)
  3. Department of Ceramic Engineering, Indian Institute of Technology (Banaras Hindu University), Varanasi 221005 (India)
Bi{sub 0.8}La{sub 0.15}RE{sub 0.05}Fe{sub 0.9}Mn{sub 0.1}O{sub 3} (where RE = Pr and Nd) have been prepared via conventional solid state route. The Rietveld refinement of X-ray diffraction patterns shows that both systems crystallize in orthorhombic Pnma space group. Raman modes observed for these two systems indicate that both systems are very close to orthorhombic Pnma structure. Appearance of prominent A{sub 1}-3 and weak E-2 modes in Bi{sub 0.8}La{sub 0.15}Nd{sub 0.05}Fe{sub 0.9}Mn{sub 0.1}O{sub 3} indicate the presence of chemically more active Bi-O covalent bonds (which favors stereochemical activity of Bi lone pair electrons) in comparison to Bi{sub 0.8}La{sub 0.15}Pr{sub 0.05}Fe{sub 0.9}Mn{sub 0.1}O{sub 3}. Moreover, Bi{sub 0.8}La{sub 0.15}Nd{sub 0.05}Fe{sub 0.9}Mn{sub 0.1}O{sub 3} system shows higher dielectric constant, low dielectric loss, and higher magnetization value in comparison to Bi{sub 0.8}La{sub 0.15}Pr{sub 0.05}Fe{sub 0.9}Mn{sub 0.1}O{sub 3} system. Ferroelectric transition temperature decreases to 460 °C for both systems in comparison to 710 °C of Bi{sub 0.8}La{sub 0.2}Fe{sub 0.9}Mn{sub 0.1}O{sub 3}. The improved dielectric and magnetic response suggests Bi{sub 0.8}La{sub 0.15}Nd{sub 0.05}Fe{sub 0.9}Mn{sub 0.1}O{sub 3} a better multiferroic system than Bi{sub 0.8}La{sub 0.15}Pr{sub 0.05}Fe{sub 0.9}Mn{sub 0.1}O{sub 3}.
OSTI ID:
22273658
Journal Information:
Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 13 Vol. 115; ISSN JAPIAU; ISSN 0021-8979
Country of Publication:
United States
Language:
English