1/f noise in semiconductor and metal nanocrystal solids

Journal Article · Mon Apr 21 00:00:00 EDT 2014 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4871682· OSTI ID:22273575

Liu, Heng; Lhuillier, Emmanuel; Guyot-Sionnest, Philippe ^[1]

---

1. James Franck Institute, The University of Chicago, 929 E 57th Street, Chicago, Illinois 60637 (United States)

Electrical 1/f noise is measured in thin films of CdSe, CdSe/CdS, ZnO, HgTe quantum dots and Au nanocrystals. The 1/f noise, normalized per nanoparticle, shows no systematic dependence on the nanoparticle material and the coupling material. However, over 10 orders of magnitude, it correlates well with the nearest neighbor conductance suggesting some universal magnitude of the 1/f noise in these granular conductors. In the hopping regime, the main mechanism of 1/f noise is determined to be mobility fluctuated. In the metallic regime obtained with gold nanoparticle films, the noise drops to a similar level as bulk gold films and with a similar temperature dependence.

• OSTI ID: 22273575
• Journal Information: Journal of Applied Physics, Vol. 115, Issue 15; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
77 NANOSCIENCE AND NANOTECHNOLOGY
CADMIUM SELENIDES
CADMIUM SULFIDES
CARRIER MOBILITY
COUPLING
GOLD
MERCURY TELLURIDES
NOISE
QUANTUM DOTS
SEMICONDUCTOR MATERIALS
SOLIDS
TEMPERATURE DEPENDENCE
THIN FILMS
ZINC OXIDES