Ceramic-polymer nanocomposites with increased dielectric permittivity and low dielectric loss
Journal Article
·
· AIP Conference Proceedings
- Centre for Materials Science and Engineering, National Institute of Technology, Hamirpur -177 005 (India)
- School of Physics and Materials Science, Thapar University, Patiala -147 004 (India)
- Centre for Energy and Environment, National Institute of Technology, Hamirpur -177005 (India)
The use of lead free materials in device fabrication is very essential from environmental point of view. We have synthesized the lead free ferroelectric polymer nanocomposite films with increased dielectric properties. Lead free bismuth titanate has been used as active ceramic nanofillers having crystallite size 24nm and PVDF as the polymer matrix. Ferroelectric β-phase of the polymer composite films was confirmed by X-ray diffraction pattern. Mapping data confirms the homogeneous dispersion of ceramic particles into the polymer matrix. Frequency dependent dielectric constant increases up to 43.4 at 100Hz, whereas dielectric loss decreases with 7 wt% bismuth titanate loading. This high dielectric constant lead free ferroelectric polymer films can be used for energy density applications.
- OSTI ID:
- 22269453
- Journal Information:
- AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1591; ISSN APCPCS; ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
77 NANOSCIENCE AND NANOTECHNOLOGY
BISMUTH
CERAMICS
COMPOSITE MATERIALS
ENERGY DENSITY
FABRICATION
FERROELECTRIC MATERIALS
FILMS
FREQUENCY DEPENDENCE
NANOSTRUCTURES
ORGANIC FLUORINE COMPOUNDS
PERMITTIVITY
POLYVINYLS
TITANATES
X-RAY DIFFRACTION
SUPERCONDUCTIVITY AND SUPERFLUIDITY
77 NANOSCIENCE AND NANOTECHNOLOGY
BISMUTH
CERAMICS
COMPOSITE MATERIALS
ENERGY DENSITY
FABRICATION
FERROELECTRIC MATERIALS
FILMS
FREQUENCY DEPENDENCE
NANOSTRUCTURES
ORGANIC FLUORINE COMPOUNDS
PERMITTIVITY
POLYVINYLS
TITANATES
X-RAY DIFFRACTION