Characterization of a random anisotropic conductivity field with Karhunen-Loeve methods
- University of Dayton Research Institute, Structural Integrity Division, 300 College Park, Dayton, OH 45469-0020 (United States)
- Victor Technologies, LLC, PO Box 7706, Bloomington, IN 47407-7706 (United States)
- Air Force Research Labs, Materials and Manufacturing Directorate, 2230 10th St., WPAFB, OH 45433 (United States)
While parametric uncertainty quantification for NDE models has been addressed in recent years, the problem of stochastic field parameters such as spatially distributed electrical conductivity has only been investigated minimally in the last year. In that work, the authors treated the field as a one-dimensional random process and Karhunen-Loeve methods were used to discretize this process to make it amenable to UQ methods such as ANOVA expansions. In the present work, we will treat the field as a two dimensional random process, and the eigenvalues and eigenfunctions of the integral operator will be determined via Galerkin methods. The Karhunen-Loeve methods is extended to two dimensions and implemented to represent this process. Several different choices for basis functions will be discussed, as well as convergence criteria for each. The methods are applied to correlation functions collected over electron backscatter data from highly micro textured Ti-7Al.
- OSTI ID:
- 22263752
- Journal Information:
- AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1581; ISSN APCPCS; ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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