Low-temperature evolution of local polarization properties of PbZr{sub 0.65}Ti{sub 0.35}O{sub 3} thin films probed by piezoresponse force microscopy
- St. Petersburg State Polytechnical University, St. Petersburg (Russian Federation)
The temperature evolution of local polarization properties in epitaxial PbZr{sub 0.65}Ti{sub 0.35}O{sub 3} films is studied by the low-temperature piezoresponse force microscopy (PFM). Pronounced changes in the film polarization state, including apparent polarization rotations and possible transitions between single-domain and polydomain states of individual ferroelectric nanocolumns, are revealed on cooling from the room temperature to 8 K using PFM imaging. More than two-fold increase in the coercive voltage extracted from the piezoresponse hysteresis loops is found on cooling from 240 to 8 K. The results are explained by the thermodynamic theory of strained epitaxial perovskite ferroelectric films.
- OSTI ID:
- 22257708
- Journal Information:
- Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 11 Vol. 104; ISSN APPLAB; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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