A NIST facility for resonant soft x-ray scattering measuring nano-scale soft matter structure at NSLS-II

Gann, Eliot; Crofts, Thomas; Holland, Glenn; Beaucage, Peter; McAfee, Terry; Kline, R. Joseph; Collins, Brian Akira; McNeill, Christopher R.; Fischer, Daniel A.; DeLongchamp, Dean M.

doi:10.1088/1361-648x/abdffb

Title: A NIST facility for resonant soft x-ray scattering measuring nano-scale soft matter structure at NSLS-II

Journal Article · Wed Mar 10 00:00:00 EST 2021 · Journal of Physics. Condensed Matter

DOI:https://doi.org/10.1088/1361-648x/abdffb· OSTI ID:2222903

^[1]; Crofts, Thomas ^[2]; Holland, Glenn ^[1]; Beaucage, Peter ^[1]; McAfee, Terry ^[3]; Kline, R. Joseph ^[1];

^[4]; McNeill, Christopher R. ^[5]; Fischer, Daniel A. ^[1]; DeLongchamp, Dean M. ^[1]

National Institute of Standards and Technology (NIST), Gaithersburg, MD (United States)
FMB-Oxford (United Kingdom)
Washington State University, Pullman, WA (United States); Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
Washington State University, Pullman, WA (United States)
Monash University, Victoria (Australia)

We present the design and performance of a polarized resonant soft x-ray scattering (RSoXS) station for soft matter characterization built by the national institute of standards and technology at the national synchrotron light source-II (NSLS-II). The RSoXS station is located within the spectroscopy soft and tender beamline suite at NSLS-II located in Brookhaven national laboratory, New York. Numerous elements of the RSoXS station were designed for optimal performance for measurements on soft matter systems, where it is of critical importance to minimize beam damage and maximize collection efficiency of polarized x-rays. These elements include a novel optical design, sample manipulator and sample environments, as well as detector setups. Lastly, we will report the performance of the measurement station, including energy resolution, higher harmonic content and suppression methods, the extent and mitigation of the carbon absorption dip on optics, and the range of polarizations available from the elliptically polarized undulator source.

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Research Organization:: Washington State Univ., Pullman, WA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities (SUF)

Grant/Contract Number:: SC0017923; SC0012704

OSTI ID:: 2222903

Journal Information:: Journal of Physics. Condensed Matter, Vol. 33, Issue 16; ISSN 0953-8984

Publisher:: IOP PublishingCopyright Statement

Country of Publication:: United States

Language:: English

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