Novel synthesis of hafnium oxide nanoparticles by precipitation method and its characterization

Journal Article · Sat Sep 15 00:00:00 EDT 2012 · Materials Research Bulletin

DOI:https://doi.org/10.1016/J.MATERRESBULL.2012.05.051· OSTI ID:22215761

Ramadoss, Ananthakumar; Krishnamoorthy, Karthikeyan ^[1]

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1. Nanomaterials and System Lab, Department of Mechanical System Engineering, Jeju National University, Jeju 690-756 (Korea, Republic of)

Highlights: ► HfO{sub 2} NPs were prepared by precipitation method. ► XRD and Raman analysis revealed the presence of monoclinic phase. ► The average particle size of HfO{sub 2} NPs is 20 nm. ► The method is a simple, low cost and eco-friendly approach. -- Abstract: Hafnium oxide nanoparticles (HfO{sub 2} NPs) have been successfully synthesized by means of a novel precipitation method and were characterized by using X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), Field emission scanning electron microscopy (FESEM), UV–visible, Fourier transform infrared (FTIR) and laser Raman spectroscopy. The XRD and Raman analysis revealed the presence of pure monoclinic HfO{sub 2} NPs. FESEM image showed that the HfO{sub 2} NPs were of spherical shape with an average particle size of about 20 nm. The optical band gap of the HfO{sub 2} NPs was found to be 6.12 eV. Advantages of this method were simple and low cost of synthesis of HfO{sub 2} NPs includes the small and narrow particle size distribution.

• OSTI ID: 22215761
• Journal Information: Materials Research Bulletin, Vol. 47, Issue 9; Other Information: Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
77 NANOSCIENCE AND NANOTECHNOLOGY
FIELD EMISSION
FOURIER TRANSFORMATION
HAFNIUM OXIDES
INFRARED SPECTRA
MONOCLINIC LATTICES
NANOSTRUCTURES
OPTICAL PROPERTIES
PARTICLE SIZE
PRECIPITATION
RAMAN SPECTROSCOPY
SCANNING ELECTRON MICROSCOPY
SYNTHESIS
X-RAY DIFFRACTION
X-RAY PHOTOELECTRON SPECTROSCOPY