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Title: Ferroelectric deaging effect of Zr{sup 4+} ions on sol–gel-derived BiFe{sub 0.95}Mn{sub 0.05}O{sub 3} thin films

Journal Article · · Materials Research Bulletin
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  1. State Key Laboratory on Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012 (China)

Highlights: ► The double P–E loops observed indicate that the BFMO film was aged. ► The double-loop feature fades away gradually with the increase of Zr content from 1 to 3 mol%. ► The deaging effect of Zr can be proved by testing the asymmetry of Ec and retention properties. -- Abstract: BiFe{sub 0.95−x}Mn{sub 0.05}Zr{sub x}O{sub 3} thin films were prepared on ITO/glass substrates using a sol–gel method. The P–E hysteresis loops before and after the high electric field treatment were measured to investigate the deaging effect of Zr{sup 4+} ions on BiFe{sub 0.95}Mn{sub 0.05}O{sub 3} thin films. It was found that the BiFe{sub 0.95}Mn{sub 0.05}O{sub 3} thin film shows typical double P–E hysteresis loops before the cycling of high electric field, indicating that the film was aged. The double-loop feature fades away gradually with the increase of zirconium doping content from 1 to 3 mol%, demonstrating that Zr{sup 4+} ions indeed have deaging effect on the aged BiFe{sub 0.95}Mn{sub 0.05}O{sub 3} film. Such deaging effect of Zr{sup 4+} ions can be further proved by comparing the asymmetry of the coercive field before and after the cycling of high electric field as well as the charge retaining capability.

OSTI ID:
22215712
Journal Information:
Materials Research Bulletin, Vol. 47, Issue 9; Other Information: Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
Country of Publication:
United States
Language:
English