Ferroelectric deaging effect of Zr{sup 4+} ions on sol–gel-derived BiFe{sub 0.95}Mn{sub 0.05}O{sub 3} thin films
- State Key Laboratory on Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012 (China)
Highlights: ► The double P–E loops observed indicate that the BFMO film was aged. ► The double-loop feature fades away gradually with the increase of Zr content from 1 to 3 mol%. ► The deaging effect of Zr can be proved by testing the asymmetry of Ec and retention properties. -- Abstract: BiFe{sub 0.95−x}Mn{sub 0.05}Zr{sub x}O{sub 3} thin films were prepared on ITO/glass substrates using a sol–gel method. The P–E hysteresis loops before and after the high electric field treatment were measured to investigate the deaging effect of Zr{sup 4+} ions on BiFe{sub 0.95}Mn{sub 0.05}O{sub 3} thin films. It was found that the BiFe{sub 0.95}Mn{sub 0.05}O{sub 3} thin film shows typical double P–E hysteresis loops before the cycling of high electric field, indicating that the film was aged. The double-loop feature fades away gradually with the increase of zirconium doping content from 1 to 3 mol%, demonstrating that Zr{sup 4+} ions indeed have deaging effect on the aged BiFe{sub 0.95}Mn{sub 0.05}O{sub 3} film. Such deaging effect of Zr{sup 4+} ions can be further proved by comparing the asymmetry of the coercive field before and after the cycling of high electric field as well as the charge retaining capability.
- OSTI ID:
- 22215712
- Journal Information:
- Materials Research Bulletin, Vol. 47, Issue 9; Other Information: Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
- Country of Publication:
- United States
- Language:
- English
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