Measurement of the unstained biological sample by a novel scanning electron generation X-ray microscope based on SEM

Journal Article · Fri Aug 07 04:00:00 EDT 2009 · Biochemical and Biophysical Research Communications

DOI:https://doi.org/10.1016/J.BBRC.2009.05.107· OSTI ID:22199758

Ogura, Toshihiko ^[1]

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1. Neuroscience Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Central 2, Umezono, Tsukuba, Ibaraki 305-8568 (Japan)

We introduced a novel X-ray microscope system based on scanning electron microscopy using thin film, which enables the measurement of unstained biological samples without damage. An unstained yeast sample was adsorbed under a titanium (Ti)-coated silicon nitride (Si{sub 3}N{sub 4}) film 90 nm thick. The X-ray signal from the film was detected by an X-ray photodiode (PD) placed below the sample. With an electron beam at 2.6 kV acceleration and 6.75 nA current, the yeast image is obtained using the X-ray PD. The image is created by soft X-rays from the Ti layer. The Ti layer is effective in generating the characteristic 2.7-nm wavelength X-rays by the irradiation of electrons. Furthermore, we investigated the electron trajectory and the generation of the characteristic X-rays within the Ti-coated Si{sub 3}N{sub 4} film by Monte Carlo simulation. Our system can be easily utilized to observe various unstained biological samples of cells, bacteria, and viruses.

• OSTI ID: 22199758
• Journal Information: Biochemical and Biophysical Research Communications, Journal Name: Biochemical and Biophysical Research Communications Journal Issue: 4 Vol. 385; ISSN 0006-291X; ISSN BBRCA9
• Country of Publication: United States
• Language: English

Related Subjects

60 APPLIED LIFE SCIENCES
BACTERIA
COMPUTERIZED SIMULATION
ELECTRON BEAMS
ELECTRON SCANNING
IRRADIATION
MICROSCOPES
MONTE CARLO METHOD
SCANNING ELECTRON MICROSCOPY
SILICON NITRIDES
SOFT X RADIATION
THIN FILMS
TITANIUM
VIRUSES
YEASTS