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Implementing an electronic sideband offset lock for isotope shift spectroscopy in radium

Journal Article · · Optics Express
DOI:https://doi.org/10.1364/oe.500578· OSTI ID:2217382
 [1];  [2];  [2];  [2];  [2];  [2];  [2];  [2];  [3]
  1. Argonne National Laboratory (ANL), Argonne, IL (United States); Michigan State Univ., East Lansing, MI (United States); Seoul National Univ. (Korea, Republic of)
  2. Argonne National Laboratory (ANL), Argonne, IL (United States)
  3. Michigan State Univ., East Lansing, MI (United States)
+ Show Author Affiliations
We demonstrate laser frequency stabilization with at least 6 GHz of offset tunability using an in-phase/quadrature (IQ) modulator to generate electronic sidebands (ESB) on a titanium sapphire laser at 714 nm and we apply this technique to perform isotope shift spectroscopy of 226Ra and 225Ra. By locking the laser to a single resonance of a high finesse optical cavity and adjusting the lock offset, we determine the frequency difference between the magneto-optical trap (MOT) transitions in the two isotopes to be 2630.0 ± 0.3 MHz, a factor of 29 more precise than the previously available data. Using the known value of the hyperfine splitting of the 3P1 level, we calculate the isotope shift for the 1S0 to 3P1 transition to be 2267.0 ± 2.2 MHz, a factor of 8 more precise than the best available value. Our technique could be applied to countless other atomic systems to provide unprecedented precision in isotope shift spectroscopy and other relative frequency comparisons.
Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE; USDOE Office of Science (SC), Nuclear Physics (NP); USDOE Office of Science (SC), Office of Isotope R&D and Production (IRP)
Grant/Contract Number:
AC02-06CH11357; SC0019455
OSTI ID:
2217382
Alternate ID(s):
OSTI ID: 2523629
Journal Information:
Optics Express, Journal Name: Optics Express Journal Issue: 25 Vol. 31; ISSN 1094-4087
Publisher:
Optical Society of America (OSA)Copyright Statement
Country of Publication:
United States
Language:
English

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