Phase II Final Technical Report
Transmission electron microscopy (TEM) is primary characterization method used to determine nanoscale features and local internal structure of materials. However, conventional TEM observations are usually performed under conditions different from a material’s actual working environment. If electrical biasing signals can be applied to the sample, then the relationship between structural properties and electronic properties can be investigated directly. Furthermore, if one at the same time subjects the sample to cryogenic temperature during imaging at high resolution, one can watch the material processes involved in structural and phase transformations as a result of electrical biasing at these low temperatures. However, there are also many technologically relevant materials systems (e.g. topological insulators, lithium batteries, etc.), which are air/moisture sensitive and prone to degrade when transported in unprotective environment in the TEM for characterization – requiring a dedicated air-free transfer hardware. Combining air-free transfer capability, temperature control using active liquid nitrogen (LN2) cooling, and with the application of electrical biasing signals will allow in-situ TEM studies of temperature induced transitions in material systems and allow real-time correlation between structure and electronic properties. Some of the important materials research areas that this capability will find application are in the study of battery materials and quantum materials such as superconductors and topological insulators that manifest their relevant behavior only at extremely low temperatures. The goal of this SBIR project was to bring to market a product family of TEM holders for in-situ cryogenic biasing imaging for JEOL and Thermo Fisher/FEI TEMs. The configurations in this product group are single tilt cryo-biasing for JEOL and Thermo Fisher/FEI TEMs (product Generation I), as well as double-tilt cryo-biasing for JEOL and Thermo Fisher/FEI TEMs (product Generation II). In this project we have developed and commercialized all the single tilt configurations and launched those as the Generation I product. Furthermore, we have laid the foundation to launch double-tilt configurations for the next generation of the product, following the original project proposal. The product information is listed on our website: https://hummingbirdscientific.com/products/cryo-biasing/ The broader impact/commercial potential of this project will be the availability of in-situ TEM cooling electrical biasing sample holders (both with and without shutter) with heating. This will enable scientists to expand the knowledge of structure-property relationships in a new class of materials, specifically the relation between temperature and electronic properties, and will allow for the accelerated development of the next generation of electronic, quantum and energy storage materials and devices.
- Research Organization:
- Hummingbird Precision Machine Co., Lacey, WA (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC)
- DOE Contract Number:
- SC0019627
- OSTI ID:
- 2217354
- Type / Phase:
- SBIR (Phase II)
- Report Number(s):
- DOE-HBS-031-F
- Country of Publication:
- United States
- Language:
- English
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