Atomic-scale chemical quantification of oxide interfaces using energy-dispersive X-ray spectroscopy

Journal Article · Mon Apr 29 04:00:00 EDT 2013 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4804184· OSTI ID:22162884

Lu, Ping; Van Benthem, Mark ^[1]; Xiong, Jie; Jia, Quanxi ^[2]

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1. Sandia National Laboratories, P.O. Box 5800, MS 1411, Albuquerque, New Mexico 87185-1411 (United States)
2. Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)

Atomic-scale quantification of chemical composition across oxide interfaces is important for understanding physical properties of epitaxial oxide nanostructures. Energy-dispersive X-ray spectroscopy (EDS) in an aberration-corrected scanning transmission electron microscope was used to quantify chemical composition across the interface of ferromagnetic La{sub 0.7}Sr{sub 0.3}MnO{sub 3} and antiferromagnetic BiFeO{sub 3} quantum structure. This research demonstrates that chemical composition at atomic columns can be quantified by Gaussian peak-fitting of EDS compositional profiles across the interface. Cation diffusion was observed at both A- and B-sublattice sites; and asymmetric chemical profiles exist across the interface, consistent with the previous studies.

• OSTI ID: 22162884
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 17 Vol. 102; ISSN APPLAB; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ANTIFERROMAGNETIC MATERIALS
ANTIFERROMAGNETISM
ASYMMETRY
BISMUTH COMPOUNDS
DIFFUSION
EPITAXY
FERROMAGNETIC MATERIALS
INTERFACES
LANTHANUM COMPOUNDS
MANGANATES
NANOSTRUCTURES
PHYSICAL PROPERTIES
STRONTIUM COMPOUNDS
TRANSMISSION ELECTRON MICROSCOPY
X RADIATION
X-RAY SPECTROSCOPY