Measurement of piezoelectric constants of lanthanum-gallium tantalate crystal by X-ray diffraction methods
Journal Article
·
· Crystallography Reports
- Russian Academy of Sciences, Shubnikov Institute of Crystallography (Russian Federation)
A method for measuring piezoelectric constants of crystals of intermediate systems by X-ray quasi-multiple-wave diffraction is proposed and implemented. This technique makes it possible to determine the piezoelectric coefficient by measuring variations in the lattice parameter under an external electric field. This method has been approved, its potential is evaluated, and a comparison with high-resolution X-ray diffraction data is performed.
- OSTI ID:
- 22156475
- Journal Information:
- Crystallography Reports, Vol. 58, Issue 1; Other Information: Copyright (c) 2013 Pleiades Publishing, Ltd.; Country of input: International Atomic Energy Agency (IAEA); ISSN 1063-7745
- Country of Publication:
- United States
- Language:
- English
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