Structure and magnetoresistance of a Ni{sub 79.7}Fe{sub 14.0}Co{sub 2.8}Zr{sub 2.0}Cu{sub 1.5} thin film
- National Academy of Sciences of Ukraine, Galkin Institute for Physics and Engineering (Ukraine)
The structure and magnetoresistance R of thin films based on Ni{sub 80}Fe{sub 20} permalloy doped with Co, Zr, and Cu have been examined by X-ray diffraction analysis and resistance measurement. The films have been obtained by ion plasma sputtering on oxidized silicon, fused quartz, and glass ceramic cold substrates. It has been shown that the structure of a film in the initial state is a mixture of solid solutions based on two phases: Ni(fcc) particles with a size of L Almost-Equal-To 8 nm and (Zr{sub 0.67}Ni{sub 0.22}O{sub 0.11}){gamma} particles with a size of L Almost-Equal-To 12 nm. The R(H) dependences on the strength and direction of the magnetic field H have been obtained at room temperature for film samples in the initial state and after isothermal annealing at 653 K for 1 h. According to R(H) dependences and X-ray diffraction analysis, films in the initial state are assumingly in a superparamagnetic state, whereas they exhibit ferromagnetic properties after isothermal annealing.
- OSTI ID:
- 22156439
- Journal Information:
- Journal of Experimental and Theoretical Physics, Vol. 116, Issue 1; Other Information: Copyright (c) 2013 Pleiades Publishing, Ltd.; Country of input: International Atomic Energy Agency (IAEA); ISSN 1063-7761
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
ANNEALING
CERAMICS
COBALT ADDITIONS
COPPER ADDITIONS
DOPED MATERIALS
FCC LATTICES
GLASS
IRON COMPOUNDS
MAGNETIC FIELDS
MAGNETORESISTANCE
NICKEL COMPOUNDS
PERMALLOY
SOLID SOLUTIONS
SUBSTRATES
SUPERPARAMAGNETISM
TEMPERATURE RANGE 0273-0400 K
THIN FILMS
X-RAY DIFFRACTION
ZIRCONIUM ADDITIONS