Using Bayesian analysis and Gaussian processes to infer electron temperature and density profiles on the Mega-Ampere Spherical Tokamak experiment

Journal Article · Sat Jun 15 00:00:00 EDT 2013 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4811378· OSTI ID:22118647

Nessi, G. T. von; Hole, M. J. ^[1]

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1. Research School of Physical Sciences and Engineering, Australian National University, Canberra ACT 0200 (Australia)

A unified, Bayesian inference of midplane electron temperature and density profiles using both Thomson scattering (TS) and interferometric data is presented. Beyond the Bayesian nature of the analysis, novel features of the inference are the use of a Gaussian process prior to infer a mollification length-scale of inferred profiles and the use of Gauss-Laguerre quadratures to directly calculate the depolarisation term associated with the TS forward model. Results are presented from an application of the method to data from the high resolution TS system on the Mega-Ampere Spherical Tokamak, along with a comparison to profiles coming from the standard analysis carried out on that system.

• OSTI ID: 22118647
• Journal Information: Review of Scientific Instruments, Vol. 84, Issue 6; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
DENSITY
ELECTRON TEMPERATURE
GAUSSIAN PROCESSES
INDIUM FLUORIDES
ION TEMPERATURE
NUMERICAL ANALYSIS
PLASMA DENSITY
PLASMA DIAGNOSTICS
QUADRATURES
SPHERICAL CONFIGURATION
THOMSON SCATTERING
TOKAMAK DEVICES