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Micro-Raman investigations of InN-GaN core-shell nanowires on Si (111) substrate

Journal Article · · AIP Advances
DOI:https://doi.org/10.1063/1.4811365· OSTI ID:22118633
;  [1];  [2]
  1. Department of Laser Studies, School of Physics, Madurai Kamaraj University, Madurai-625 021 (India)
  2. Centre for Nanoscience and Nanotechnology, School of Physics, Bharathidasan University, Tiruchirappalli-620 024 (India)
The electron-phonon interactions in InN-GaN core-shell nanowires grown by plasma assisted- molecular beam epitaxy (MBE) on Si (111) substrate have been analysed using micro-Raman spectroscopic technique with the excitation wavelength of 633, 488 and 325 nm. The Raman scattering at 633 nm reveals the characteristic E{sub 2} (high) and A{sub 1} (LO) phonon mode of InN core at 490 and 590 cm{sup -1} respectively and E{sub 2} (high) phonon mode of GaN shell at 573 cm{sup -1}. The free carrier concentration of InN core is found to be low in the order {approx} 10{sup 16} cm{sup -3} due to the screening of charge carriers by thin GaN shell. Diameter of InN core evaluated using the spatial correlation model is consistent with the transmission electron microscopic measurement of {approx}15 nm. The phonon-life time of core-shell nanowire structure is estimated to be {approx}0.4 ps. The micro-Raman mapping and its corresponding localised spectra for 325 nm excitation exhibit intense E{sub 2} (high) phonon mode of GaN shell at 573 cm{sup -1} as the decrease of laser interaction length and the signal intensity is quenched at the voids due to high spacing of NWs.
OSTI ID:
22118633
Journal Information:
AIP Advances, Journal Name: AIP Advances Journal Issue: 6 Vol. 3; ISSN AAIDBI; ISSN 2158-3226
Country of Publication:
United States
Language:
English