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The ReA electron-beam ion trap charge breeder for reacceleration of rare isotopes

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.4802378· OSTI ID:22116999
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  1. National Superconducting Cyclotron Laboratory (NSCL), Michigan State University (MSU), 640 South Shaw Lane, East Lansing, MI 48824 (United States)

ReA is a post-accelerator at the National Superconducting Cyclotron Laboratory at Michigan State University. ReA is designed to reaccelerate rare isotopes to energies of a few MeV/u following production by projectile fragmentation and thermalization in a gas cell. The facility consists of four main components: an electron-beam ion trap (EBIT) charge breeder, an achromatic charge-over-mass (Q/A) separator, a radio-frequency quadrupole accelerator, and a superconducting radio-frequency linear accelerator. The EBIT charge breeder was specifically designed to efficiently capture continuous beams of singly charged ions injected at low energy (<60 keV), charge breed in less than 50 ms, and extract highly charged ions to the Q/A separator for charge-state selection and reacceleration through the accelerator structures. The use of highly charged ions to reach high beam energies is a key aspect that makes ReA a compact and cost-efficient post-accelerator. The EBIT is characterized by a high-current electron gun, a long multi-electrode trap structure and a dual magnet to provide both the high electron-beam current density necessary for fast charge breeding of short-lived isotopes as well as the high capture probability of injected beams. This paper presents an overview and the status of the ReA EBIT, which has extracted for reacceleration tests stable {sup 20}Ne{sup 8+} ion beams produced from injected gas and more recently {sup 39}K{sup 16+} beams by injecting stable {sup 39,41}K{sup +} ions from an external ion source.

OSTI ID:
22116999
Journal Information:
AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1525; ISSN APCPCS; ISSN 0094-243X
Country of Publication:
United States
Language:
English