Upgraded X-ray topography and microtomography beamline at the Kurchatov synchrotron radiation source

Journal Article · Wed May 15 00:00:00 EDT 2013 · Crystallography Reports

DOI:https://doi.org/10.1134/S1063774513030206· OSTI ID:22113611

Khlebnikov, A. S.; Vyazovetskova, A. E.; Blinov, I. A.; Golubitskii, A. O.; Kazakov, I. V.; Vorob'ev, A. A. ^[1]; Buzmakov, A. V.; Asadchikov, V. E.; Shishkov, V. A. ^[2]; Mukhamedzhanov, E. Kh.; Kovalchuk, M. V. ^[1]

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1. National Research Centre 'Kurchatov Institute' (Russian Federation)
2. Russian Academy of Sciences, Shubnikov Institute of Crystallography (Russian Federation)

An upgraded X-ray Topography and Microtomography (XRT-MT) station is described, the parameters of the optical schemes and detectors are given, and the experimental possibilities of the station are analyzed. Examples of tomographic reconstructions are reported which demonstrate spatial resolutions of 2.5 and 10 {mu}m at fields of view of 2.5 and 10 mm, respectively.

• OSTI ID: 22113611
• Journal Information: Crystallography Reports, Vol. 58, Issue 3; Other Information: Copyright (c) 2013 Pleiades Publishing, Ltd.; Country of input: International Atomic Energy Agency (IAEA); ISSN 1063-7745
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CRYSTAL STRUCTURE
SPATIAL RESOLUTION
SYNCHROTRON RADIATION SOURCES
TOPOGRAPHY
X RADIATION