X-ray irradiation of soda-lime glasses studied in situ with surface plasmon resonance spectroscopy

Journal Article · Thu Mar 21 00:00:00 EDT 2013 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4794807· OSTI ID:22102301

Serrano, A. ^[1]; Galvez, F.; Garcia, M. A. ^[1]

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1. Instituto de Ceramica y Vidrio (ICV-CSIC), Cantoblanco, 28049 Madrid (Spain)

We present here a study of hard X-ray irradiation of soda-lime glasses performed in situ and in real time. For this purpose, we have used a Au thin film grown on glass and studied the excitation of its surface plasmon resonance (SPR) while irradiating the sample with X-rays, using a recently developed experimental setup at a synchrotron beamline [Serrano et al., Rev. Sci. Instrum. 83, 083101 (2012)]. The extreme sensitivity of the SPR to the features of the glass substrate allows probing the modifications caused by the X-rays. Irradiation induces color centers in the soda-lime glass, modifying its refractive index. Comparison of the experimental results with simulated data shows that both, the real and the imaginary parts of the refractive index of soda-lime glasses, change upon irradiation in time intervals of a few minutes. After X-ray irradiation, the effects are partially reversible. The defects responsible for these modifications are identified as non-bridging oxygen hole centers, which fade by recombination with electrons after irradiation. The kinetics of the defect formation and fading process are also studied in real time.

• OSTI ID: 22102301
• Journal Information: Journal of Applied Physics, Vol. 113, Issue 11; Other Information: (c) 2013 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
36 MATERIALS SCIENCE
CALCIUM COMPOUNDS
COLOR CENTERS
CRYSTAL DEFECTS
EXCITATION
GLASS
GOLD
HARD X RADIATION
IRRADIATION
MODIFICATIONS
RECOMBINATION
REFRACTIVE INDEX
RESONANCE
SENSITIVITY
SIMULATION
SODIUM CARBONATES
SPECTROSCOPY
SUBSTRATES
SURFACES
THIN FILMS