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Title: A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies

Abstract

We report on the design and performance of a wavelength-dispersive type spectrometer based on the von Hamos geometry. The spectrometer is equipped with a segmented-type crystal for x-ray diffraction and provides an energy resolution in the order of 0.25 eV and 1 eV over an energy range of 8000 eV-9600 eV. The use of a segmented crystal results in a simple and straightforward crystal preparation that allows to preserve the spectrometer resolution and spectrometer efficiency. Application of the spectrometer for time-resolved resonant inelastic x-ray scattering and single-shot x-ray emission spectroscopy is demonstrated.

Authors:
 [1];  [2]; ; ; ; ; ; ; ; ; ; ;  [1];  [1];  [3]; ; ;  [4];  [5]
  1. Paul Scherrer Institut, 5232 Villigen PSI (Switzerland)
  2. (Poland)
  3. (Switzerland)
  4. Department of Physics, University of Fribourg, 1700 Fribourg (Switzerland)
  5. University of Technology, Kielce (Poland)
Publication Date:
OSTI Identifier:
22093773
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 83; Journal Issue: 10; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; CRYSTALLOGRAPHY; CRYSTALS; EFFICIENCY; EMISSION SPECTROSCOPY; ENERGY RESOLUTION; KEV RANGE 01-10; PERFORMANCE; TIME RESOLUTION; WAVELENGTHS; X RADIATION; X-RAY DIFFRACTION; X-RAY SPECTROMETERS; X-RAY SPECTROSCOPY

Citation Formats

Szlachetko, J., Institute of Physics, Jan Kochanowski University, 25-406 Kielce, Nachtegaal, M., Boni, E. de, Willimann, M., Safonova, O., Sa, J., Smolentsev, G., Szlachetko, M., Bergamaschi, A., Schmitt, B., David, C., Luecke, A., Bokhoven, J. A. van, Institute for Chemical and Bioengineering, ETH Zurich, 8093 Zuerich, Dousse, J.-Cl., Hoszowska, J., Kayser, Y., and Jagodzinski, P. A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies. United States: N. p., 2012. Web. doi:10.1063/1.4756691.
Szlachetko, J., Institute of Physics, Jan Kochanowski University, 25-406 Kielce, Nachtegaal, M., Boni, E. de, Willimann, M., Safonova, O., Sa, J., Smolentsev, G., Szlachetko, M., Bergamaschi, A., Schmitt, B., David, C., Luecke, A., Bokhoven, J. A. van, Institute for Chemical and Bioengineering, ETH Zurich, 8093 Zuerich, Dousse, J.-Cl., Hoszowska, J., Kayser, Y., & Jagodzinski, P. A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies. United States. doi:10.1063/1.4756691.
Szlachetko, J., Institute of Physics, Jan Kochanowski University, 25-406 Kielce, Nachtegaal, M., Boni, E. de, Willimann, M., Safonova, O., Sa, J., Smolentsev, G., Szlachetko, M., Bergamaschi, A., Schmitt, B., David, C., Luecke, A., Bokhoven, J. A. van, Institute for Chemical and Bioengineering, ETH Zurich, 8093 Zuerich, Dousse, J.-Cl., Hoszowska, J., Kayser, Y., and Jagodzinski, P. Mon . "A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies". United States. doi:10.1063/1.4756691.
@article{osti_22093773,
title = {A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies},
author = {Szlachetko, J. and Institute of Physics, Jan Kochanowski University, 25-406 Kielce and Nachtegaal, M. and Boni, E. de and Willimann, M. and Safonova, O. and Sa, J. and Smolentsev, G. and Szlachetko, M. and Bergamaschi, A. and Schmitt, B. and David, C. and Luecke, A. and Bokhoven, J. A. van and Institute for Chemical and Bioengineering, ETH Zurich, 8093 Zuerich and Dousse, J.-Cl. and Hoszowska, J. and Kayser, Y. and Jagodzinski, P.},
abstractNote = {We report on the design and performance of a wavelength-dispersive type spectrometer based on the von Hamos geometry. The spectrometer is equipped with a segmented-type crystal for x-ray diffraction and provides an energy resolution in the order of 0.25 eV and 1 eV over an energy range of 8000 eV-9600 eV. The use of a segmented crystal results in a simple and straightforward crystal preparation that allows to preserve the spectrometer resolution and spectrometer efficiency. Application of the spectrometer for time-resolved resonant inelastic x-ray scattering and single-shot x-ray emission spectroscopy is demonstrated.},
doi = {10.1063/1.4756691},
journal = {Review of Scientific Instruments},
number = 10,
volume = 83,
place = {United States},
year = {Mon Oct 15 00:00:00 EDT 2012},
month = {Mon Oct 15 00:00:00 EDT 2012}
}