Note: Grazing incidence small and wide angle x-ray scattering combined with imaging ellipsometry

Journal Article · Sun Jul 15 00:00:00 EDT 2012 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4738880· OSTI ID:22093677

Koerstgens, V.; Meier, R.; Ruderer, M. A.; Guo, S.; Chiang, H. -Y.; Mueller-Buschbaum, P. ^[1]; Perlich, J.; Roth, S. V.; Gehrke, R. ^[2]

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1. Technische Universitaet Muenchen, Physik-Department, Lehrstuhl fuer Funktionelle Materialien, James-Franck-Str. 1, 85748 Garching (Germany)
2. HASYLAB, DESY, Notkestr. 85, 22607, Hamburg (Germany)

The combination of grazing incidence small angle x-ray scattering (GISAXS) and grazing incidence wide angle x-ray scattering (GIWAXS) with optical imaging ellipsometry is presented as an upgrade of the available measurement techniques at the wiggler beamline BW4 of the Hamburger Synchrotronstrahlungslabor. The instrument is introduced with the description of the alignment procedure to assure the measurement of imaging ellipsometry and GISAXS/GIWAXS on the same sample spot. To demonstrate the possibilities of the new instrument examples of morphological investigation on films made of poly(3-hexylthiophene) and [6,6]-phenyl-C{sub 61} butyric acid methyl ester as well as textured poly(9,9-dioctylfluorene-alt-benzo-thia-diazole) are shown.

• OSTI ID: 22093677
• Journal Information: Review of Scientific Instruments, Vol. 83, Issue 7; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
BUTYRIC ACID
ELLIPSOMETRY
FILMS
POLYMERS
SMALL ANGLE SCATTERING
X RADIATION
X-RAY DIFFRACTION