Phase change behaviors of Zn-doped Ge{sub 2}Sb{sub 2}Te{sub 5} films
- Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083 (China)
- Faculty of Information Science and Engineering, Ningbo University, Ningbo 315211 (China)
- Laser Physics Centre, Australian National University, Canberra, ACT 0200 (Australia)
- Shanghai Institute of Micro-system and Information Technology, Chinese Academy of Sciences, Shanghai 200050 (China)
Zn-doped Ge{sub 2}Sb{sub 2}Te{sub 5} phase-change materials have been investigated for phase change memory applications. Zn{sub 15.16}(Ge{sub 2}Sb{sub 2}Te{sub 5}){sub 84.84} phase change film exhibits a higher crystallization temperature ({approx}258 Degree-Sign C), wider band gap ({approx}0.78 eV), better data retention of 10 years at 167.5 Degree-Sign C, higher crystalline resistance, and faster crystallization speed compared with the conventional Ge{sub 2}Sb{sub 2}Te{sub 5}. The proper Zn atom added into Ge{sub 2}Sb{sub 2}Te{sub 5} serves as a center for suppression of the face-centered-cubic (fcc) phase to hexagonal close-packed (hcp) phase transition, and fcc phase has high thermal stability partially due to the bond recombination among Zn, Sb, and Te atoms.
- OSTI ID:
- 22089326
- Journal Information:
- Applied Physics Letters, Vol. 101, Issue 5; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
ANTIMONY COMPOUNDS
ATOMS
CHEMICAL BONDS
CRYSTALLIZATION
CRYSTAL-PHASE TRANSFORMATIONS
DOPED MATERIALS
ENERGY GAP
FCC LATTICES
GERMANIUM COMPOUNDS
GLASS
HCP LATTICES
INHIBITION
PHASE CHANGE MATERIALS
RECOMBINATION
SEMICONDUCTOR MATERIALS
SOLIDS
STABILITY
TELLURIUM COMPOUNDS
THIN FILMS
ZINC ADDITIONS