Grazing incidence extreme ultraviolet spectrometer fielded with time resolution in a hostile Z-pinch environment
- Plasma Physics and Diagnostics Laboratory, Physics Department, University of Nevada, Reno, Nevada 89557 (United States)
This recently developed diagnostic was designed to allow for time-gated spectroscopic study of the EUV radiation (4 nm < {lambda} < 15 nm) present during harsh wire array z-pinch implosions. The spectrometer utilizes a 25 {mu}m slit, an array of 3 spherical blazed gratings at grazing incidence, and a microchannel plate (MCP) detector placed in an off-Rowland position. Each grating is positioned such that its diffracted radiation is cast over two of the six total independently timed frames of the MCP. The off-Rowland configuration allows for a much greater spectral density on the imaging plate but only focuses at one wavelength per grating. The focal wavelengths are chosen for their diagnostic significance. Testing was conducted at the Zebra pulsed-power generator (1 MA, 100 ns risetime) at University of Nevada, Reno on a series of wire array z-pinch loads. Within this harsh z-pinch environment, radiation yields routinely exceed 20 kJ in the EUV and soft x-ray. There are also strong mechanical shocks, high velocity debris, sudden vacuum changes during operation, energic ion beams, and hard x-ray radiation in excess of 50 keV. The spectra obtained from the precursor plasma of an Al double planar wire array contained lines of Al IX and AlX ions indicating a temperature near 60 eV during precursor formation. Detailed results will be presented showing the fielding specifications and the techniques used to extract important plasma parameters using this spectrometer.
- OSTI ID:
- 22085909
- Journal Information:
- Review of Scientific Instruments, Vol. 82, Issue 9; Other Information: (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
EV RANGE
EXTREME ULTRAVIOLET RADIATION
GRATINGS
HARD X RADIATION
ION BEAMS
LINEAR Z PINCH DEVICES
MICROCHANNEL ELECTRON MULTIPLIERS
PLASMA
PRECURSOR
PULSE GENERATORS
SHOCK WAVES
SOFT X RADIATION
SPECTRAL DENSITY
SPECTROMETERS
TIME RESOLUTION
WAVELENGTHS