Publisher' Note: ''Effect of in-situ oxygen on the electronic properties of graphene grown by carbon molecular beam epitaxy'' [Appl. Phys. Lett. 100, 133107 (2012)]
- Air Force Research Laboratory, Materials and Manufacturing Directorate (AFRL/RXPS), Wright-Patterson AFB, Ohio 45433-7707 (United States)
- Department of Physics, University of Dayton, Dayton, Ohio 45469 (United States)
No abstract prepared.
- OSTI ID:
- 22080404
- Journal Information:
- Applied Physics Letters, Vol. 100, Issue 25; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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