Synthesis and characterization of molybdenum catalysts supported on {gamma}-Al{sub 2}O{sub 3}-CeO{sub 2} composite oxides
- Department of Chemical EngineeringUniversiti Teknologi PETRONAS Bandar Seri Iskandar, 31750 Tronoh, Perak (Malaysia)
The physical and chemical properties of a catalyst play a vital role in various industrial applications. Molybdenum catalysts supported on {gamma}-Al{sub 2}O{sub 3} and {gamma}-Al{sub 2}O{sub 3}-CeO{sub 2} mixed oxides with varying loading of CeO{sub 2} (5, 10, 15, 20 wt% with respect to {gamma}-Al{sub 2}O{sub 3}) were prepared by wet impregnation method. The physiochemical properties of these synthesized Mo catalysts were studied with various characterization techniques such as X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), temperature-programmed reduction (TPR), field emission scanning electron microscopy-energy dispersive analysis (FESEM-EDX) and X-ray fluorescence spectrometer (XRF). The results showed that the addition of CeO{sub 2} into the support affected the binding energies of the elements and reducibility of the metal oxides formed after calcination of catalyst samples due to the change in metal-support interaction. Further, the characterization techniques showed that the active metal was well dispersed on the surface of support material.
- OSTI ID:
- 22075563
- Journal Information:
- AIP Conference Proceedings, Vol. 1482, Issue 1; Conference: ICFAS2012: International conference on fundamental and applied sciences, Kuala Lumpur (Malaysia), 12-14 Jun 2012; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
36 MATERIALS SCIENCE
ALUMINIUM OXIDES
BINDING ENERGY
CALCINATION
CATALYSTS
CERIUM OXIDES
CHEMICAL PROPERTIES
COMPOSITE MATERIALS
FIELD EMISSION
FLUORESCENCE
MOLYBDENUM
SCANNING ELECTRON MICROSCOPY
SURFACES
SYNTHESIS
X-RAY DIFFRACTION
X-RAY FLUORESCENCE ANALYSIS
X-RAY PHOTOELECTRON SPECTROSCOPY