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Title: Gauge properties of the guiding center variational symplectic integrator

Journal Article · · Physics of Plasmas
DOI:https://doi.org/10.1063/1.4714608· OSTI ID:22072333
;  [1];  [1]
  1. Plasma Physics Laboratory, Princeton University, Princeton, New Jersey 08543 (United States)

Variational symplectic algorithms have recently been developed for carrying out long-time simulation of charged particles in magnetic fields [H. Qin and X. Guan, Phys. Rev. Lett. 100, 035006 (2008); H. Qin, X. Guan, and W. Tang, Phys. Plasmas (2009); J. Li, H. Qin, Z. Pu, L. Xie, and S. Fu, Phys. Plasmas 18, 052902 (2011)]. As a direct consequence of their derivation from a discrete variational principle, these algorithms have very good long-time energy conservation, as well as exactly preserving discrete momenta. We present stability results for these algorithms, focusing on understanding how explicit variational integrators can be designed for this type of system. It is found that for explicit algorithms, an instability arises because the discrete symplectic structure does not become the continuous structure in the t{yields}0 limit. We examine how a generalized gauge transformation can be used to put the Lagrangian in the 'antisymmetric discretization gauge,' in which the discrete symplectic structure has the correct form, thus eliminating the numerical instability. Finally, it is noted that the variational guiding center algorithms are not electromagnetically gauge invariant. By designing a model discrete Lagrangian, we show that the algorithms are approximately gauge invariant as long as A and {phi} are relatively smooth. A gauge invariant discrete Lagrangian is very important in a variational particle-in-cell algorithm where it ensures current continuity and preservation of Gauss's law [J. Squire, H. Qin, and W. Tang (to be published)].

OSTI ID:
22072333
Journal Information:
Physics of Plasmas, Vol. 19, Issue 5; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 1070-664X
Country of Publication:
United States
Language:
English