Development of grating-based x-ray Talbot interferometry at the advanced photon source

Journal Article · Tue Jul 31 00:00:00 EDT 2012 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4742300· OSTI ID:22069169

Marathe, Shashidhara; Xianghui, Xiao; Wojcik, Michael J; Divan, Ralu; Butler, Leslie G; Ham, Kyungmin; Fezzaa, Kamel; Erdmann, Mark; Wen, Han H; Lee, Wah-Keat; Macrander, Albert T; De Carlo, Francesco; Mancini, Derrick C; Assoufid, Lahsen ^[1]

---

1. Advanced Photon Source, Argonne National Laboratory, 9700 S Cass Ave, IL 60439 (United States)

We report on the ongoing effort to develop hard x-ray Talbot interferometry at the Advanced Photon Source (APS), Argonne National Laboratory, USA. We describe the design of the interferometer and preliminary results obtained at 25 keV using a feather and a phantom sample lithographically fabricated of gold. We mention the future developmental goals and applications of this technique as a metrology tool for x-ray optics and beam wavefront characterization.

• OSTI ID: 22069169
• Journal Information: AIP Conference Proceedings, Vol. 1466, Issue 1; Conference: International workshop on X-ray and neutron phase imaging with gratings, Tokyo (Japan), 5-7 Mar 2012; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ADVANCED PHOTON SOURCE
ANL
DESIGN
DIFFRACTION GRATINGS
FABRICATION
GOLD
HARD X RADIATION
INTERFEROMETERS
INTERFEROMETRY
KEV RANGE
OPTICS
PHANTOMS
VISIBLE RADIATION