Charge transport of ultrathin CoPc films on LaAlO{sub 3}(001) substrate

Journal Article · Mon Jun 25 00:00:00 EDT 2012 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4732433· OSTI ID:22068993

Samanta, Soumen; Kumar, Arvind; Singh, Ajay; Debnath, A K; Aswal, D K; Gupta, S K ^[1]

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1. Technical Physics Division, Bhabha Atomic Research Center, Trombay, Mumbai-400085 (India)

We have grown cobalt-phthalocyanine (CoPc) films of thickness 20nm on LaAlO{sub 3} (001) substrate using molecular beam epitaxy (MBE). The existence of natural twin boundary in LaAlO{sub 3} single crystal assist in ordering of molecule along the twin boundary direction. The ordering is confirmed by GIXRD and rocking measurement. The charge transport measurement along ordered direction shows a very high mobility of 7 cm{sup 2}V{sup -1}Sec{sup -1} at room temperature and current-voltage (J-V) characteristics can be described by trap free space charge limited conduction (SCLC). In contrast conductivity, measured across the ordered direction, is four orders lower as compared to the conductivity, along the ordered direction. The low conductivity is attributed to the traps at the grain boundary between two ordered regions. The J-V characteristics, measured across the ordered direction, can easily be described by trap controlled space charge limited conduction.

• OSTI ID: 22068993
• Journal Information: AIP Conference Proceedings, Vol. 1451, Issue 1; Conference: Indian Vacuum Society symposium on thin films, Mumbai (India), 9-12 Nov 2011; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALUMINATES
CHARGE TRANSPORT
COBALT COMPLEXES
COBALT COMPOUNDS
CRYSTAL GROWTH
CRYSTAL STRUCTURE
FILMS
GRAIN BOUNDARIES
LANTHANUM COMPOUNDS
LAYERS
MOLECULAR BEAM EPITAXY
MONOCRYSTALS
ORGANIC SEMICONDUCTORS
SUBSTRATES
TRAPS
X-RAY DIFFRACTION