Fast in-situ annealing stage coupled with EBSD: A suitable tool to observe quick recrystallization mechanisms

Journal Article · Wed Aug 15 04:00:00 EDT 2012 · Materials Characterization

DOI:https://doi.org/10.1016/J.MATCHAR.2012.04.020· OSTI ID:22066478

Bozzolo, N; Jacomet, S; Loge, R E

A heating stage has been developed to perform in-situ annealing in a SEM equipped with an EBSD system in order to study recrystallization mechanisms. High temperature treatments could then be performed inside the SEM, up to 1180 Degree-Sign C and with high heating and cooling rates ({approx} 100 Degree-Sign C s{sup -1}). Samples were cooled down to room temperature to perform EBSD orientation mapping in between successive short-duration heat treatments. Microstructure evolution snapshots obtained this way allow gaining an insight into recrystallization mechanisms. The interest of such experiments is shown for two examples: static recrystallization of cold deformed pure tantalum and post-dynamic evolution of hot-deformed Zircaloy4. - Highlights: Black-Right-Pointing-Pointer Heating stage for in-SEM annealing at high temperature (up to 1200 Degree-Sign C). Black-Right-Pointing-Pointer High heating and cooling rates (100 Degree-Sign C s{sup -1}), no temperature overshoot. Black-Right-Pointing-Pointer Sequential observation of very fast recrystallization mechanisms.

• OSTI ID: 22066478
• Journal Information: Materials Characterization, Journal Name: Materials Characterization Journal Issue: Complete Vol. 70; ISSN 1044-5803; ISSN MACHEX
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ANNEALING
BACKSCATTERING
ELECTRON DIFFRACTION
HEATING
MICROSTRUCTURE
RECRYSTALLIZATION
SCANNING ELECTRON MICROSCOPY
TANTALUM
TEMPERATURE DEPENDENCE
ZIRCALOY 4
ZIRCONIUM