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Title: Electron density measurement of cesium seeded negative ion source by surface wave probe

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.3671745· OSTI ID:22066291

Electron density measurements of a large-scaled negative ion source were carried out with a surface wave probe. By comparison of the electron densities determined with the surface wave probe and a Langmuir probe, it was confirmed that the surface wave probe is highly available for diagnostic of the electron density in H{sup -} ion sources. In addition, it was found that the ratio of the electron density to the H{sup -} ion density dramatically decreases with increase of a bias voltage and the H{sup -} ions become dominant negative particles at the bias voltage of more than 6 V.

OSTI ID:
22066291
Journal Information:
Review of Scientific Instruments, Vol. 83, Issue 2; Conference: ICIS 2011: 14. international conference on ion sources, Giardini-Naxos, Sicily (Italy), 12-16 Sep 2011; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
Country of Publication:
United States
Language:
English