Electron density measurement of cesium seeded negative ion source by surface wave probe
Journal Article
·
· Review of Scientific Instruments
- National Institute for Fusion Science, Toki 509-5292 (Japan)
Electron density measurements of a large-scaled negative ion source were carried out with a surface wave probe. By comparison of the electron densities determined with the surface wave probe and a Langmuir probe, it was confirmed that the surface wave probe is highly available for diagnostic of the electron density in H{sup -} ion sources. In addition, it was found that the ratio of the electron density to the H{sup -} ion density dramatically decreases with increase of a bias voltage and the H{sup -} ions become dominant negative particles at the bias voltage of more than 6 V.
- OSTI ID:
- 22066291
- Journal Information:
- Review of Scientific Instruments, Vol. 83, Issue 2; Conference: ICIS 2011: 14. international conference on ion sources, Giardini-Naxos, Sicily (Italy), 12-16 Sep 2011; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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