The electron spectro-microscopy beamline at National Synchrotron Light Source II: A wide photon energy range, micro-focusing beamline for photoelectron spectro-microscopies

Journal Article · Wed Feb 15 00:00:00 EST 2012 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3681440· OSTI ID:22063786

Reininger, R; Hulbert, S L; Chubar, O; Vescovo, E ^[1]; Johnson, P D; Valla, T ^[2]; Sadowski, J T; Starr, D E ^[3]

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1. Photon Sciences Directorate, Brookhaven National Laboratory, Upton, New York 11973 (United States)
2. Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton, New York 11973 (United States)
3. Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, New York 11973 (United States)

A comprehensive optical design for a high-resolution, high-flux, wide-energy range, micro-focused beamline working in the vacuum ultraviolet and soft x-ray photon energy range is proposed. The beamline is to provide monochromatic radiation to three photoelectron microscopes: a full-field x-ray photoelectron emission microscope and two scanning instruments, one dedicated to angle resolved photoemission spectroscopy ({mu}-ARPES) and one for ambient pressure x-ray photoelectron spectroscopy and scanning photoelectron microscopy (AP-XPS/SPEM). Microfocusing is achieved with state of the art elliptical cylinders, obtaining a spot size of 1 {mu}m for ARPES and 0.5 {mu}m for AP-XPS/SPEM. A detailed ray tracing analysis quantitatively evaluates the overall beamline performances.

• OSTI ID: 22063786
• Journal Information: Review of Scientific Instruments, Vol. 83, Issue 2; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CYLINDERS
DESIGN
ENERGY RANGE
FOCUSING
MICROSCOPES
MONOCHROMATIC RADIATION
NSLS
PERFORMANCE
PHOTOEMISSION
PHOTONS
RESOLUTION
SCANNING ELECTRON MICROSCOPY
SOFT X RADIATION
ULTRAVIOLET RADIATION
X-RAY PHOTOELECTRON SPECTROSCOPY