Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope
Journal Article
·
· Review of Scientific Instruments
- Department of Physics, McGill University, 3600 Rue University, Montreal, QC H3A2T8 (Canada)
A modification of the common electrochemical etching setup is presented. The described method reproducibly yields sharp tungsten tips for usage in the scanning tunneling microscope and tuning fork atomic force microscope. In situ treatment under ultrahigh vacuum (p {<=}10{sup -10} mbar) conditions for cleaning and fine sharpening with minimal blunting is described. The structure of the microscopic apex of these tips is atomically resolved with field ion microscopy and cross checked with field emission.
- OSTI ID:
- 22063753
- Journal Information:
- Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 11 Vol. 82; ISSN 0034-6748; ISSN RSINAK
- Country of Publication:
- United States
- Language:
- English
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