Multifrequency channel microwave reflectometer with frequency hopping operation for density fluctuation measurements in Large Helical Device

Journal Article · Fri Oct 15 04:00:00 EDT 2010 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3478747· OSTI ID:22058699

Tokuzawa, T; Kawahata, K ^[1]; Ejiri, A ^[2]

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1. National Institute for Fusion Science, 322-6 Oroshi-cho, Toki 509-5292 (Japan)
2. Graduate School of Frontier Sciences, University of Tokyo, Kashiwa 277-8561 (Japan)

In order to measure the internal structure of density fluctuations using a microwave reflectometer, the broadband frequency tunable system, which has the ability of fast and stable hopping operation, has been improved in the Large Helical Device. Simultaneous multipoint measurement is the key issue of this development. For accurate phase measurement, the system utilizes a single sideband modulation technique. Currently, a dual channel heterodyne frequency hopping reflectometer system has been constructed and applied to the Alfven eigenmode measurements.

• OSTI ID: 22058699
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 10 Vol. 81; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
FLUCTUATIONS
LHD DEVICE
MICROWAVE RADIATION
PLASMA DENSITY
PLASMA DIAGNOSTICS
REFLECTION