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Title: X-ray imaging of structural defects in Si{sub 1-x}Ge{sub x} single crystals using a white synchrotron beam

Abstract

Nonmonochromatic (white) synchrotron radiation with a high spatial coherence makes it possible to use different types of interaction of X-rays with matter simultaneously: diffraction, refraction, absorption, and fluorescence. In this case, the structure of materials is studied by the real-time recording of high-resolution images of different types under the same conditions. The use of X-ray images for studying the structural quality is demonstrated by the example of Czochralski-grown Si{sub 1-x}Ge{sub x} single crystals. The effect that the germanium content has on the formation and evolution of the defect structure is analyzed and the relationship between the structure and properties is investigated. The experiments were performed on the Pohang Light Source (Pohang, Republic of Korea).

Authors:
; ;  [1];  [2];  [3]
  1. Russian Academy of Sciences, Ioffe Physicotechnical Institute (Russian Federation)
  2. Institute of Crystal Growth (Germany)
  3. Pohang University of Science and Technology (Korea, Republic of)
Publication Date:
OSTI Identifier:
22054265
Resource Type:
Journal Article
Journal Name:
Crystallography Reports
Additional Journal Information:
Journal Volume: 56; Journal Issue: 5; Other Information: Copyright (c) 2011 Pleiades Publishing, Ltd.; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 1063-7745
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; DEFECTS; ENERGY ABSORPTION; FLUORESCENCE; GERMANIUM ALLOYS; IMAGES; INTERACTIONS; MONOCRYSTALS; POHANG LIGHT SOURCE; REFRACTION; RESOLUTION; SILICON ALLOYS; SYNCHROTRON RADIATION; X RADIATION; X-RAY DIFFRACTION

Citation Formats

Argunova, T. S., E-mail: argunova2002@mail.ru, Zabrodskii, A. G., Sorokin, L. M., Abrosimov, N. V., and Je, J. H. X-ray imaging of structural defects in Si{sub 1-x}Ge{sub x} single crystals using a white synchrotron beam. United States: N. p., 2011. Web. doi:10.1134/S1063774511050038.
Argunova, T. S., E-mail: argunova2002@mail.ru, Zabrodskii, A. G., Sorokin, L. M., Abrosimov, N. V., & Je, J. H. X-ray imaging of structural defects in Si{sub 1-x}Ge{sub x} single crystals using a white synchrotron beam. United States. doi:10.1134/S1063774511050038.
Argunova, T. S., E-mail: argunova2002@mail.ru, Zabrodskii, A. G., Sorokin, L. M., Abrosimov, N. V., and Je, J. H. Thu . "X-ray imaging of structural defects in Si{sub 1-x}Ge{sub x} single crystals using a white synchrotron beam". United States. doi:10.1134/S1063774511050038.
@article{osti_22054265,
title = {X-ray imaging of structural defects in Si{sub 1-x}Ge{sub x} single crystals using a white synchrotron beam},
author = {Argunova, T. S., E-mail: argunova2002@mail.ru and Zabrodskii, A. G. and Sorokin, L. M. and Abrosimov, N. V. and Je, J. H.},
abstractNote = {Nonmonochromatic (white) synchrotron radiation with a high spatial coherence makes it possible to use different types of interaction of X-rays with matter simultaneously: diffraction, refraction, absorption, and fluorescence. In this case, the structure of materials is studied by the real-time recording of high-resolution images of different types under the same conditions. The use of X-ray images for studying the structural quality is demonstrated by the example of Czochralski-grown Si{sub 1-x}Ge{sub x} single crystals. The effect that the germanium content has on the formation and evolution of the defect structure is analyzed and the relationship between the structure and properties is investigated. The experiments were performed on the Pohang Light Source (Pohang, Republic of Korea).},
doi = {10.1134/S1063774511050038},
journal = {Crystallography Reports},
issn = {1063-7745},
number = 5,
volume = 56,
place = {United States},
year = {2011},
month = {9}
}