Lattice Parameter Local Determination for Trigonal, Hexagonal, and Tetragonal Crystal Systems Using Several Coplanar X-Ray Reflections
- Russian Academy of Sciences, Shubnikov Institute of Crystallography (Russian Federation)
The method for determining the local lattice parameters using quasi-multiple X-ray diffraction (which was proposed and used only for crystals of the cubic system) has been expanded to measure the local crystal lattice parameters for the trigonal, hexagonal, and tetragonal systems. Local variations in the lattice parameters in the tetragonal paratellurite (TeO{sub 2}) and trigonal lanthanum-gallium tantalate (La{sub 3}Ga{sub 5.5}Ta{sub 0.5}O{sub 14}) crystals have been investigated. Reflections necessary for implementing the quasi-multiple X-ray diffraction scheme are found for these crystals. The pairs of reflections that were found were used to complete quasi-multiple X-ray diffraction schemes on a laboratory X-ray source and determine the variation in the lattice parameter a along the surface of these crystals. The relative measurement error was 4 x 10{sup -6} at a spatial resolution of 140 {mu}m. The accuracy of the method and the parameters determining this characteristic were analyzed based on the results. The locality of the method and the limits of the spatial resolution of an X-ray diffraction measurement of lattice parameters are estimated.
- OSTI ID:
- 22054061
- Journal Information:
- Crystallography Reports, Vol. 55, Issue 6; Other Information: Copyright (c) 2010 Pleiades Publishing, Ltd.; Country of input: International Atomic Energy Agency (IAEA); ISSN 1063-7745
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ACCURACY
CRYSTALS
GALLIUM COMPOUNDS
HEXAGONAL LATTICES
LANTHANUM COMPOUNDS
LATTICE PARAMETERS
OXIDES
REFLECTION
SPATIAL RESOLUTION
TANTALUM COMPOUNDS
TELLURIUM OXIDES
TETRAGONAL LATTICES
TRIGONAL LATTICES
X RADIATION
X-RAY DIFFRACTION
X-RAY SOURCES