skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Space-resolved vacuum ultraviolet spectrometer system for edge impurity and temperature profile measurement in HL-2A

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.3378288· OSTI ID:22053977
; ; ; ; ; ; ; ; ; ;  [1];  [2];  [3]
  1. Southwestern Institute of Physics, P.O. Box 432, Chengdu 610041 (China)
  2. National Institute for Fusion Science, Toki 509-5292, Gifu (Japan)
  3. Department of Fusion Science, Graduate University for Advanced Studies, Toki 509-5292, Gifu (Japan)

A 1 m normal incidence vacuum ultraviolet (VUV) spectrometer has been developed for spatial distribution measurement of edge impurity line emission in the wavelength range of 300-3200 A on HL-2A tokamak. A vertical profile of the impurity line emission is measured with a space-resolved slit placed between an entrance slit and a grating of the spectrometer. Two concave 1200 grooves/mm gratings blazed at 800 and 1500 A are set on a rotatable holder in the spectrometer, which gives wavelength dispersion of 0.12 mm/A. A back-illuminated charge-coupled device is used as a detector with an image size of 6.7x26.6 mm{sup 2} (26x26 {mu}m{sup 2}/pixel). An excellent spatial resolution of 2 mm is obtained with good spectral resolution of 0.15 A when the space-resolved slit of 50 {mu}m in width is used. The space-resolved spectra thus provide three radial profiles of emission line intensity, ion temperature, and poloidal rotation. The electron temperature can be measured by the intensity ratio, e.g., CIII 2s{sup 2}-2s3p (386 A)/2s{sup 2}-2s2p (977 A). The sensitivity of the spectrometer is calibrated in situ by using the VUV bremsstrahlung continuum radiation emitted from the tokamak plasma. A good performance of the spectrometer system for the edge impurity and temperature profile measurements is presented with results on Ohmic and H-mode discharges.

OSTI ID:
22053977
Journal Information:
Review of Scientific Instruments, Vol. 81, Issue 4; Other Information: (c) 2010 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
Country of Publication:
United States
Language:
English