Electron beam ion source and electron beam ion trap (invited)
Journal Article
·
· Review of Scientific Instruments
- Scientific Software Service, Kapellenweg 2a, D-63571 Gelnhausen (Germany)
- National Superconducting Cyclotron Laboratory, Michigan State University, East Lansing, Michigan 48824 (United States)
The electron beam ion source (EBIS) and its trap variant [electron beam ion trap (EBIT)] celebrated their 40th and 20th anniversary, respectively, at the EBIS/T Symposium 2007 in Heidelberg. These technologically challenging sources of highly charged ions have seen a broad development in many countries over the last decades. In contrast to most other ion sources the recipe of improvement was not ''sorcery'' but a clear understanding of the physical laws and obeying the technological constraints. This review will report important achievements of the past as well as promising developments in the future.
- OSTI ID:
- 22053816
- Journal Information:
- Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 2 Vol. 81; ISSN 0034-6748; ISSN RSINAK
- Country of Publication:
- United States
- Language:
- English
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