Corrected direct force balance method for atomic force microscopy lateral force calibration

Journal Article · Mon Jun 15 04:00:00 EDT 2009 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3142243· OSTI ID:22053594

Asay, David B; Hsiao, Erik; Kim, Seong H ^[1]

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1. Department of Chemical Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802 (United States)

This paper reports corrections and improvements of the previously reported direct force balance method (DFBM) developed for lateral calibration of atomic force microscopy. The DFBM method employs the lateral force signal obtained during a force-distance measurement on a sloped surface and relates this signal to the applied load and the slope of the surface to determine the lateral calibration factor. In the original publication [Rev. Sci. Instrum. 77, 043903 (2006)], the tip-substrate contact was assumed to be pinned at the point of contact, i.e., no slip along the slope. In control experiments, the tip was found to slide along the slope during force-distance curve measurement. This paper presents the correct force balance for lateral force calibration.

• OSTI ID: 22053594
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 6 Vol. 80; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ATOMIC FORCE MICROSCOPY
CALIBRATION
CONTROL
CORRECTIONS
DISTANCE
SIGNALS
SUBSTRATES
SURFACES