High-resolution, high-transmission soft x-ray spectrometer for the study of biological samples

Journal Article · Mon Jun 15 00:00:00 EDT 2009 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3133704· OSTI ID:22053574

Fuchs, O; Weinhardt, L; Blum, M; Weigand, M; Umbach, E ^[1]; Baer, M; Heske, C ^[2]; Denlinger, J; Chuang, Y -D; McKinney, W; Hussain, Z ^[3]; Gullikson, E; Jones, M; Batson, P ^[4]; Nelles, B ^[5]; Follath, R ^[6]

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1. Universitaet Wuerzburg, Experimentelle Physik II, Am Hubland, 97074 Wuerzburg (Germany)
2. Department of Chemistry, University of Nevada, 4505 Maryland Pkwy., Las Vegas, Nevada 89154-4003 (United States)
3. Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)
4. Center for X-Ray Optics, Material Science Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)
5. Carl Zeiss Laser Optics GmbH, Carl-Zeiss-Str. 22, 73447 Oberkochen (Germany)
6. Berliner Elektronenspeicherring-Gesellschaft fuer Synchrotronstrahlung m.b.H., Albert-Einstein-Str. 15, 12489 Berlin (Germany)

We present a variable line-space grating spectrometer for soft x-rays that covers the photon energy range between 130 and 650 eV. The optical design is based on the Hettrick-Underwood principle and tailored to synchrotron-based studies of radiation-sensitive biological samples. The spectrometer is able to record the entire spectral range in one shot, i.e., without any mechanical motion, at a resolving power of 1200 or better. Despite its slitless design, such a resolving power can be achieved for a source spot as large as (30x3000) {mu}m{sup 2}, which is important for keeping beam damage effects in radiation-sensitive samples low. The high spectrometer efficiency allows recording of comprehensive two-dimensional resonant inelastic soft x-ray scattering (RIXS) maps with good statistics within several minutes. This is exemplarily demonstrated for a RIXS map of highly oriented pyrolytic graphite, which was taken within 10 min.

• OSTI ID: 22053574
• Journal Information: Review of Scientific Instruments, Vol. 80, Issue 6; Other Information: (c) 2009 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DESIGN
EFFICIENCY
EV RANGE
GRAPHITE
GRATINGS
PHOTONS
RADIATION EFFECTS
RESOLUTION
SOFT X RADIATION
STATISTICS
TRANSMISSION
X-RAY DIFFRACTION
X-RAY SPECTROMETERS