A simple atomic force microscopy calibration method for direct measurement of surface energy on nanostructured surfaces covered with molecularly thin liquid films

Journal Article · Fri May 15 04:00:00 EDT 2009 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3136908· OSTI ID:22053570

Brunner, Ralf; Talke, Frank E ^[1]; Etsion, Izhak ^[2]

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1. University of California San Diego, La Jolla, California 92093-0401 (United States)
2. Department of Mechanical Engineering, Technion-Israel Institute of Technology, Haifa 32000 (Israel)

A simple calibration method is described for the determination of surface energy by atomic force microscopy (AFM) pull-off force measurements on nanostructured surfaces covered with molecularly thin liquid films. The method is based on correlating pull-off forces measured in arbitrary units on a nanostructured surface with pull-off forces measured on macroscopically smooth dip-coated gauge surfaces with known surface energy. The method avoids the need for complex calibration of the AFM cantilever stiffness and the determination of the radius of curvature of the AFM tip. Both of the latter measurements are associated with indirect and less accurate measurements of surface energy based on various contact mechanics adhesion models.

• OSTI ID: 22053570
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 5 Vol. 80; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ADHESION
ATOMIC FORCE MICROSCOPY
CALIBRATION
FLEXIBILITY
LIQUIDS
MEASURING METHODS
NANOSTRUCTURES
SURFACE ENERGY
THIN FILMS