Ion spectrometer composed of time-of-flight and Thomson parabola spectrometers for simultaneous characterization of laser-driven ions

Journal Article · Fri May 15 00:00:00 EDT 2009 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3131628· OSTI ID:22053554

Choi, I W; Kim, C M; Sung, J H; Yu, T J; Lee, S K; Kim, I J; Jin, Y -Y; Jeong, T M; Hafz, N; Pae, K H; Noh, Y -C; Ko, D -K; Lee, J ^[1]; Yogo, A; Pirozhkov, A S; Ogura, K; Orimo, S; Sagisaka, A; Nishiuchi, M; Daito, I ^[2] ; others, and

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1. Advanced Photonics Research Institute and Center for Femto-Atto Science and Technology, GIST, Gwangju 500-712 (Korea, Republic of)
2. Advanced Photon Research Center and Photo Medical Research Center, Japan Atomic Energy Agency, Kizugawa, Kyoto 619-0215 (Japan)

An ion spectrometer, composed of a time-of-flight spectrometer (TOFS) and a Thomson parabola spectrometer (TPS), has been developed to measure energy spectra and to analyze species of laser-driven ions. Two spectrometers can be operated simultaneously, thereby facilitate to compare the independently measured data and to combine advantages of each spectrometer. Real-time and shot-to-shot characterizations have been possible with the TOFS, and species of ions can be analyzed with the TPS. The two spectrometers show very good agreement of maximum proton energy even for a single laser shot. The composite ion spectrometer can provide two complementary spectra measured by TOFS with a large solid angle and TPS with a small one for the same ion source, which are useful to estimate precise total ion number and to investigate fine structure of energy spectrum at high energy depending on the detection position and solid angle. Advantage and comparison to other online measurement system, such as the TPS equipped with microchannel plate, are discussed in terms of overlay of ion species, high-repetition rate operation, detection solid angle, and detector characteristics of imaging plate.

• OSTI ID: 22053554
• Journal Information: Review of Scientific Instruments, Vol. 80, Issue 5; Other Information: (c) 2009 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DETECTION
ENERGY SPECTRA
FINE STRUCTURE
ION SOURCES
IONS
LASERS
MICROCHANNEL ELECTRON MULTIPLIERS
PROTONS
TIME-OF-FLIGHT MASS SPECTROMETERS