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Title: Inner-shell photoionization spectroscopy on deposited metal clusters using soft x-ray synchrotron radiation: An experimental setup

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.3267193· OSTI ID:22051128
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  1. Helmholtz-Zentrum Berlin fuer Materialien und Energie, Wilhelm-Conrad-Roentgen-Campus Adlershof, Elektronenspeicherring BESSY II, Albert-Einstein Strasse 15, D-12489 Berlin (Germany)

Exploration of mass-selected clusters by soft x-ray synchrotron radiation is well suited to receive element specific information on clusters in contact with a support and to systematically follow the evolution of size-dependent electronic and geometrical properties from the smallest clusters toward the bulk. Here we describe an experimental setup, which combines cluster synthesis, mass selection, soft landing, ultrahigh vacuum transfer, and photoionization experiments such as x-ray photoelectron spectroscopy, x-ray absorption, and Auger electron spectroscopy. First spectroscopic results and experimental conditions are briefly discussed for Cu{sub 19} deposited onto the natural oxide layer of a Si-wafer surface.

OSTI ID:
22051128
Journal Information:
Review of Scientific Instruments, Vol. 80, Issue 12; Other Information: (c) 2009 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
Country of Publication:
United States
Language:
English