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Title: Development and performance test of a soft x-ray polarimeter and ellipsometer for complete polarization analysis

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.3204458· OSTI ID:22051028
; ; ;  [1];  [2]
  1. Quantum Beam Science Directorate, Japan Atomic Energy Agency, 8-1-7, Umemidai, Kizugawa, Kyoto 619-0215 (Japan)
  2. Shimadzu Emit Co. Ltd., 2-5-23, Kitahama, Chuo-ku, Osaka 541-0041 (Japan)

A new apparatus for polarimetric and ellipsometric measurements based on the rotating-analyzer method in the soft x-ray region has been designed, constructed, and installed in the soft x-ray beamline (BL-11) at the SR Center of Ritsumeikan University, Shiga, Japan. It can realize the optical configurations for the complete polarization analysis by using six independently movable drive shafts. A demonstration of the capabilities of the apparatus has been performed using Mo/Si multilayer polarizers deposited by an ion beam sputtering method. It is for the first time shown that the degree of linear polarization of monochromatized light from the BL-11 is approximately 87% at 92 eV since the beamline has been constructed.

OSTI ID:
22051028
Journal Information:
Review of Scientific Instruments, Vol. 80, Issue 8; Other Information: (c) 2009 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
Country of Publication:
United States
Language:
English