Single-Crystalline cooperite (PtS): Crystal-Chemical characterization, ESR spectroscopy, and {sup 195}Pt NMR spectroscopy
Journal Article
·
· Crystallography Reports
- Far East Division, Russian Academy of Sciences, Institute of Geology and Nature Management (Russian Federation)
- Lulea University of Technology (Sweden)
Single-crystalline cooperite (PtS) with a nearly stoichiometric composition was characterized in detail by X-ray diffraction, electron-probe X-ray microanalysis, and high-resolution scanning electron microscopy. For the first time it was demonstrated that {sup 195}Pt static and MAS NMR spectroscopy can be used for studying natural platinum minerals. The {sup 195}Pt chemical-shift tensor of cooperite was found to be consistent with the axial symmetry and is characterized by the following principal values: {delta}{sub xx} = -5920 ppm, {delta}{sub yy} = -3734 ppm, {delta}{sub zz} = +4023 ppm, and {delta}{sub iso} = -1850 ppm. According to the ESR data, the samples of cooperite contain copper(II), which is adsorbed on the surface during the layer-by-layer crystal growth and is not involved in the crystal lattice.
- OSTI ID:
- 22050980
- Journal Information:
- Crystallography Reports, Journal Name: Crystallography Reports Journal Issue: 3 Vol. 53; ISSN 1063-7745; ISSN CYSTE3
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
AXIAL SYMMETRY
CHEMICAL SHIFT
COPPER
CRYSTAL GROWTH
CRYSTAL LATTICES
ELECTRON PROBES
ELECTRON SPIN RESONANCE
LAYERS
MICROANALYSIS
MINERALS
MONOCRYSTALS
NMR SPECTRA
NUCLEAR MAGNETIC RESONANCE
PLATINUM 195
PLATINUM SULFIDES
SCANNING ELECTRON MICROSCOPY
STOICHIOMETRY
SURFACES
X-RAY DIFFRACTION
SUPERCONDUCTIVITY AND SUPERFLUIDITY
AXIAL SYMMETRY
CHEMICAL SHIFT
COPPER
CRYSTAL GROWTH
CRYSTAL LATTICES
ELECTRON PROBES
ELECTRON SPIN RESONANCE
LAYERS
MICROANALYSIS
MINERALS
MONOCRYSTALS
NMR SPECTRA
NUCLEAR MAGNETIC RESONANCE
PLATINUM 195
PLATINUM SULFIDES
SCANNING ELECTRON MICROSCOPY
STOICHIOMETRY
SURFACES
X-RAY DIFFRACTION