Columnar grain growth of FePt(L1{sub 0}) thin films

Journal Article · Sun Apr 01 04:00:00 EDT 2012 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.3679463· OSTI ID:22038923

En, Yang; Hoan, Ho ^[1]; Laughlin, David E ^[1]; Jiangang, Zhu ^[1]

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1. Data Storage Systems Center, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213 (United States)

An experimental approach for obtaining perpendicular FePt-SiOx thin films with a large height to diameter ratio FePt(L1{sub 0}) columnar grains is presented in this work. The microstructure for FePt-SiOx composite thin films as a function of oxide volume fraction, substrate temperature, and film thickness is studied by plan view and cross section TEM. The relations between processing, microstructure, epitaxial texture, and magnetic properties are discussed. By tuning the thickness of the magnetic layer and the volume fraction of oxide in the film at a sputtering temperature of 410 deg. C, a 16 nm thick perpendicular FePt film with {approx}8 nm diameter of FePt grains was obtained. The height to diameter ratio of the FePt grains was as large as 2. Ordering at lower temperature can be achieved by introducing a Ag sacrificial layer.

• OSTI ID: 22038923
• Journal Information: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 7 Vol. 111; ISSN JAPIAU; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
COMPOSITE MATERIALS
DEPOSITION
EPITAXY
GRAIN GROWTH
GRAIN SIZE
HYSTERESIS
IRON ALLOYS
LAYERS
MAGNETIC PROPERTIES
PLATINUM ALLOYS
SILICON OXIDES
SPUTTERING
SUBSTRATES
TEXTURE
THIN FILMS
TRANSMISSION ELECTRON MICROSCOPY