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Title: Mega-electron-volt proton irradiation on supported and suspended graphene: A Raman spectroscopic layer dependent study

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.3647781· OSTI ID:22038744
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  1. Department of Electrical and Computer Engineering, National University of Singapore, Singapore 117576 (Singapore)
  2. Center for Ion Beam Applications (CIBA), Department of Physics, National University of Singapore, Singapore 117542 (Singapore)
  3. Division of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, Singapore 637371 (Singapore)
  4. NUSNNI-NanoCore, National University of Singapore, Singapore 117576 (Singapore)

Graphene samples with 1, 2, and 4 layers and 1 + 1 folded bi-layers and graphite have been irradiated with 2 MeV protons at fluences ranging from 1 x 10{sup 15} to 6 x 10{sup 18} ions/cm{sup 2}. The samples were characterized using visible and UV Raman spectroscopy and Raman microscopy. The ion-induced defects were found to decrease with increasing number of layers. Graphene samples suspended over etched holes in SiO{sub 2} have been fabricated and used to investigate the influence of the substrate SiO{sub 2} for defect creation in graphene. While Raman vibrational modes at 1460 cm{sup -1} and 1555 cm{sup -1} have been observed in the visible Raman spectra of substantially damaged graphene samples, these modes were absent in the irradiated-suspended monolayer graphene.

OSTI ID:
22038744
Journal Information:
Journal of Applied Physics, Vol. 110, Issue 8; Other Information: (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
Country of Publication:
United States
Language:
English