Signal-to-noise ratio in x ray dark-field imaging using a grating interferometer
Journal Article
·
· Journal of Applied Physics
- Siemens AG, Corporate Technology, Muenchen 80200 (Germany)
- Paul Scherrer Institut, 5232 Villigen PSI (Switzerland)
- Technische Universitaet Dresden, Dresden 01062 (Germany)
- Technische Universitaet Muenchen, Garching 85748 (Germany)
In this work, we report an analytical and experimental investigation of the signal-to-noise ratio for a recently developed method called x ray dark-field imaging. Our approach is based on the propagation of signal and noise through the reconstruction algorithm. We find that the statistical nature of the dark-field images can be understood by a Rician distribution. The analysis shows that, for high flux, the noise in the dark-field images is proportional to the noise in the raw data. In the limit of low flux and, thus, low signal-to-noise ratio, the dark-field signal exhibits a breakdown of the signal transmission, which can be described by an asymptotic behavior of the underlying noise distribution. In this limit, the dark-field signal is no longer connected to the coherence degradation, but rather to the attenuation in the sample. The model is verified in exemplary test measurements using a compact laboratory setup with a polychromatic source and a photon counting detector.
- OSTI ID:
- 22038686
- Journal Information:
- Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 5 Vol. 110; ISSN JAPIAU; ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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