The dislocation density and twin-boundary frequency determined by X-ray peak profile analysis in cold rolled magnetron-sputter deposited nanotwinned copper
- Department of Materials Physics, Eoetvoes University Budapest (Hungary)
- Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)
- Texas A and M University, College Station, Texas (United States)
The dislocation density and the average twin boundary frequency is determined quantitatively in as-deposited and cold-rolled nanotwinned Cu thin films by high-resolution X-ray line profile analysis. After cold-rolling the dislocation density increases considerably, whereas the twin boundary frequency decreases only slightly. The physical parameters of the substructure provided by the quantitative X-ray analysis are in agreement with earlier transmission electron microscopy observations. The flow stress of the as-deposited and the cold-rolled films is directly correlated with the average thickness of twin lamellae and the dislocation density by taking into account the Hall-Petch and Taylor type strengthening mechanisms.
- OSTI ID:
- 22038673
- Journal Information:
- Journal of Applied Physics, Vol. 110, Issue 4; Other Information: (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
Similar Records
The mechanism of twin thickening and the elastic strain state of TWIP steel nanotwins
Optimization of strength and ductility in nanotwinned ultrafine grained Ag: twin density and grain orientations