Computer simulation on spatial resolution of X-ray bright-field imaging by dynamical diffraction theory for a Laue-case crystal analyzer
- Graduate School of Engineering, Kyushu Institute of Technology, Kitakyushu 804-8550 (Japan)
- Research Institute for Science and Technology, Tokyo University of Science, 2461 Yamasaki, Noda, Chiba 278-8510 (Japan)
Recently, dark-field imaging (DFI) and bright-field imaging (BFI) have been proposed and applied to visualize X-ray refraction effects yielded in biomedical objects. In order to clarify the spatial resolution due to a crystal analyzer in Laue geometry, a program based on the Takagi-Taupin equation was modified to be used for carrying out simulations to evaluate the spatial resolution of images coming into a Laue angular analyzer (LAA). The calculation was done with a perfect plane wave for diffraction wave-fields, which corresponded to BFI, under the conditions of 35 keV and a diffraction index 440 for a 2100 {mu}m thick LAA. As a result, the spatial resolution along the g-vector direction showed approximately 37.5 {mu}m. 126 {mu}m-thick LAA showed a spatial resolution better than 3.1 {mu}m under the conditions of 13.7 keV and a diffraction index 220.
- OSTI ID:
- 22036756
- Journal Information:
- Journal of Applied Physics, Vol. 110, Issue 8; Other Information: (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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